A novel approach to study radiation track structure with nanometer-equivalent resolution
نویسندگان
چکیده
منابع مشابه
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We introduce ”microdeflectometry”, a novel technique for measuring the microtopology of specular surfaces. The primary data is the local slope of the surface under test. Measuring the slope instead of the height implies high information efficiency and extreme sensitivity to local shape irregularities. The lateral resolution can be better than one micron whereas the resulting height resolution i...
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We introduce ”microdeflectometry”, a novel technique for measuring the microtopography of specular surfaces. The primary data is the local slope of the surface under test. Measuring the slope instead of the height implies high information efficiency and extreme sensitivity to local shape irregularities. The lateral resolution can be better than 1μm, whereas the resulting height resolution is in...
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ژورنال
عنوان ژورنال: The European Physical Journal D
سال: 2014
ISSN: 1434-6060,1434-6079
DOI: 10.1140/epjd/e2014-40841-0